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[IEEE IEEE 1998 International Interconnect Technology Conference - San Francisco, CA, USA (1-3 June 1998)] Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102) - Low-k dielectrics influence on crosstalk: electromagnetic analysis and characterization
Cregut, C., Le Carval, G., Chilo, J.Year:
1998
Language:
english
DOI:
10.1109/IITC.1998.704751
File:
PDF, 267 KB
english, 1998