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[IEEE 2009 Spanish Conference on Electron Devices (CDE) - Santiago de Compostela, Spain (2009.02.11-2009.02.13)] 2009 Spanish Conference on Electron Devices - Study of surface roughness in extremely small Si nanowire MOSFETs using fully-3D NEGFs
Seoane, Natalia, Martinez, Antonio, Brown, Andrew R., Asenov, AsenYear:
2009
Language:
english
DOI:
10.1109/SCED.2009.4800460
File:
PDF, 293 KB
english, 2009