[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - The related effects of increased PN junction area on ESD protection capability
Liu Po-Ching,, Lee, B., Eng Aik Lian,, Gan Cheong Hock,, Wang Haibo,Year:
1995
Language:
english
DOI:
10.1109/IPFA.1995.487607
File:
PDF, 651 KB
english, 1995