Spatial Distribution Measurement of Dynamic Voltage Drop...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2013 / 01 Vol. 21; Iss. 1

Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise

Takeuchi, Kan, Shimada, Masaki, Sato, Takao, Katsuki, Yusaku, Yoshikawa, Hiroumi, Matsushita, Hiroaki
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
21
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2011.2180742
Date:
January, 2013
File:
PDF, 1001 KB
english, 2013
Conversion to is in progress
Conversion to is failed