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[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Measurement of the MOSFET drain current variation under high gate voltage

Tetsuo Chagawa,, Kazuo Terada,, Jianyu Xiang,, Katsuhiro Tsuji,, Takaaki Tsunomura,, Akio Nishida,
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Year:
2008
DOI:
10.1109/ICMTS.2008.4509319
File:
PDF, 212 KB
2008
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