[IEEE 2012 International Caribbean Conference on Devices,...

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[IEEE 2012 International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Playa del Carmen, Mexico (2012.03.14-2012.03.17)] 2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Determination of the ion erosion rate during the SIMS analysis on AlxGa1−xAs as a function of x using HRXRD

Koudriavtseva, O., Kudriavtsev, Y., Escobosa, A., Sanchez-R, V. M.
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Year:
2012
Language:
english
DOI:
10.1109/ICCDCS.2012.6188947
File:
PDF, 2.09 MB
english, 2012
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