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[IEEE ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics - Guimaraes, Portugal (7-11 July 1997)] ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics - Real time defect detection using image segmentation
Miteran, J., Geveaux, P., Bailly, R., Gorria, P.Volume:
2
Year:
1997
Language:
english
DOI:
10.1109/ISIE.1997.649082
File:
PDF, 551 KB
english, 1997