[IEEE 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems (BTAS) - Washington, DC, USA (2009.09.28-2009.09.30)] 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems - On assessing the robustness of pen coordinates, pen pressure and pen inclination to time variability with personal entropy

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