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[Int. Test Conference International Test Conference - Washington, DC, USA (2-6 Oct. 1994)] Proceedings., International Test Conference - ATPG for heat dissipation minimization during test application

Seongmoon Wang,, Gupta, S.K.
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Year:
1994
Language:
english
DOI:
10.1109/TEST.1994.527956
File:
PDF, 1006 KB
english, 1994
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