Fatigue Life Study of ITO/PET Specimens in Terms of Electrical Resistance and Stress/Strain Via Cyclic Bending Tests
Li, Tse-Chang, Han, Chang-Fu, Chen, Kuan-Ting, Lin, Jen-FinVolume:
9
Language:
english
Journal:
Journal of Display Technology
DOI:
10.1109/JDT.2013.2251318
Date:
July, 2013
File:
PDF, 2.83 MB
english, 2013