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[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Electrical characterization of partially insulated MOSFETs with buried insulators under source/drain regions
Chang Woo Oh,, Kyoung Hwan Yeo,, Min Sang Kim,, Chang-Sub Lee,, Dong Uk Choi,, Sung Hwan Kim,, Sung-Young Lee,, Sung-Min Kim,, Jung-Dong Choe,, Yong Kyu Lee,, Eun-Jung Yoon,, Ming Li,, SunYear:
2004
Language:
english
DOI:
10.1109/ESSDER.2004.1356532
File:
PDF, 280 KB
english, 2004