[IEEE International Technical Digest on Electron Devices...

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[IEEE International Technical Digest on Electron Devices Meeting - Washington, DC, USA (3-6 Dec. 1989)] International Technical Digest on Electron Devices Meeting - A lag-free 1024*1024 progressive scan interline CCD image sensor with antiblooming and exposure control

Stevens, E.G., Burkey, B.C., Nichols, D.N., Yee, Y., Losee, D.L., Lee, T.H., Tredwell, T.J., Khosla, R.P.
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Year:
1989
Language:
english
DOI:
10.1109/IEDM.1989.74253
File:
PDF, 461 KB
english, 1989
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