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[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - Evaluation of low-ohmic resistance measurement capabilities between VSL and NIST
Rietveld, Gert, van der Beek, Jan, Kraft, MarlinYear:
2012
Language:
english
DOI:
10.1109/CPEM.2012.6250868
File:
PDF, 458 KB
english, 2012