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[IEEE 2014 IEEE 29th International Conference on Microelectronics (MIEL) - Belgrade, Serbia (2014.5.12-2014.5.14)] 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 - Refractive index measurement in TCO layers for micro optoelectronic devices

Daliento, S., Guerriero, P., Addonizio, M., Antonaia, A., Gambale, E.
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Year:
2014
Language:
english
DOI:
10.1109/MIEL.2014.6842138
File:
PDF, 494 KB
english, 2014
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