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[IEEE 2014 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2014.5.28-2014.5.30)] 2014 IEEE International Conference on IC Design & Technology - Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs
Kamei, Masayuki, Takao, Yoshinori, Eriguchi, Koji, Ono, KouichiYear:
2014
Language:
english
DOI:
10.1109/ICICDT.2014.6838598
File:
PDF, 699 KB
english, 2014