![](/img/cover-not-exists.png)
[IEEE 64th ARFTG Microwave Measurements Conference, Fall 2004. - Orlando, FL, USA (Dec. 2-3, 2004)] 64th ARFTG Microwave Measurements Conference, Fall 2004. - On-chip microwave test circuits for production IC measurements
Eisenstadt, W.R., Fox, R.M., Qizhang Yin,, Jang-Sup Yoon,, Tao Zhang,Year:
2004
Language:
english
DOI:
10.1109/ARFTGF.2004.1427602
File:
PDF, 865 KB
english, 2004