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[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution [CMOS]
Ming-Dou Ker,, Jeng-Jie Peng,, Hsin-Chin Jiang,Year:
2002
Language:
english
DOI:
10.1109/IPFA.2002.1025617
File:
PDF, 828 KB
english, 2002