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[IEEE 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops) - Anchorage, AK, USA (2008.06.23-2008.06.28)] 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops - Asymmetric and symmetric unbiased image registration: Statistical assessment of performance
Yanovsky, Igor, Thompson, Paul M., Osher, Stanley, Leow, Alex D.Year:
2008
Language:
english
DOI:
10.1109/CVPRW.2008.4562988
File:
PDF, 842 KB
english, 2008