Extending the Trait–State–Occasion Model: How Important Is...

Extending the Trait–State–Occasion Model: How Important Is Within-Wave Measurement Equivalence?

Ciesla, Jeffrey A., Cole, David A., Steiger, James H.
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Volume:
14
Language:
english
Journal:
Structural Equation Modeling: A Multidisciplinary Journal
DOI:
10.1080/10705510709336737
Date:
January, 2007
File:
PDF, 141 KB
english, 2007
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