[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Low power and high speed current-mode memristor-based TLGs
Dara, Chandra Babu, Haniotakis, Themistoklis, Tragoudas, SpyrosYear:
2013
Language:
english
DOI:
10.1109/DFT.2013.6653588
File:
PDF, 1.08 MB
english, 2013