Long-Term Stability Characteristics of Commonly Used Channel Electron Multipliers
Klettke, B. D., Krym, N. D., Wolber, W. G.Volume:
17
Year:
1970
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.1970.4325563
File:
PDF, 1.23 MB
english, 1970