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[IEEE Conference Record of the 1991 IEEE Industry Applications Society Annual Meeting - Dearborn, MI, USA (28 Sept.-4 Oct. 1991)] Conference Record of the 1991 IEEE Industry Applications Society Annual Meeting - Characterization of charge accumulation and detrapping processes related to latent failure in CMOS integrated circuits
Greason, W.D., Chum, K.Year:
1991
DOI:
10.1109/IAS.1991.178230
File:
PDF, 575 KB
1991