[IEEE 2010 76th ARFTG Microwave Measurement Conference -...

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[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Understanding transistor channel temperature in nonlinear microwave measurements and device operation

Baylis, Charles, Jean, Buford Randall, Martin, Josh, Wang, Loria, Moldovan, Matthew, Miller, Hunter
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Year:
2010
Language:
english
DOI:
10.1109/ARFTG76.2010.5700061
File:
PDF, 109 KB
english, 2010
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