[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Understanding transistor channel temperature in nonlinear microwave measurements and device operation
Baylis, Charles, Jean, Buford Randall, Martin, Josh, Wang, Loria, Moldovan, Matthew, Miller, HunterYear:
2010
Language:
english
DOI:
10.1109/ARFTG76.2010.5700061
File:
PDF, 109 KB
english, 2010