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[IEEE IEEE International Workshop on Memory Technology, Design and Testing, - Singapore (August 13-14, 1996)] IEEE International Workshop on Memory Technology, Design and Testing, - RAM diagnostic tests
Yarmolik, V.N., Klimets, Yu.V., van de Goor, A.J., Demidenko, S.N.Year:
1996
Language:
english
DOI:
10.1109/MTDT.1996.782499
File:
PDF, 252 KB
english, 1996