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[IEEE Seventh IEEE Semiconductor Thermal Measurement and Management Symposium - Phoenix, AZ, USA (12-14 Feb. 1991)] 1991 Proceedings, Seventh IEEE Semiconductor Thermal Measurement and Management Symposium - Thermal interaction of semiconductor devices on copper-clad ceramic substrates
Hussein, M.M., Nelson, D.J., Elshabini-Riad, A.Year:
1991
Language:
english
DOI:
10.1109/STHERM.1991.152924
File:
PDF, 474 KB
english, 1991