[IEEE 1991 IEEE International SOI Conference - Vail Valley,...

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[IEEE 1991 IEEE International SOI Conference - Vail Valley, CO, USA (1-3 Oct. 1991)] 1991 IEEE International SOI Conference Proceedings - Materials properties and carrier recombination lifetimes in thin epi-less bond-etch silicon on insulator (EL-BESOI)

Pronko, P.P., McCormick, A.W., Rai, A.K., Hunt, C.E., Desmond, C.A., Chen, X.
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Year:
1991
Language:
english
DOI:
10.1109/SOI.1991.162872
File:
PDF, 243 KB
english, 1991
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