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[IEEE 1991, International Test Conference - Nashville, TN (Oct. 26-30 1991)] 1991, Proceedings. International Test Conference - A Methodology for Designing Optimal Self-Checking Sequential Circuits
Parekhji, R.A., Venkatesh, G., Sherlekar, S.D.Year:
1991
Language:
english
DOI:
10.1109/TEST.1991.519520
File:
PDF, 800 KB
english, 1991