Selection of a Laser Reliability Assurance Strategy for a Long-Life Application
Nash, F. R., Joyce, W. B., Hartman, R. L., Gordon, E. I., Dixon, R. W.Volume:
64
Language:
english
Journal:
AT&T Technical Journal
DOI:
10.1002/j.1538-7305.1985.tb00445.x
Date:
March, 1985
File:
PDF, 2.70 MB
english, 1985