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[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Flexible, simplified CMOS on Si(110) with metal gate / high k for HP and LSTP
Harris, H. R., Thompson, S. E., Krishnan, S., Kirsch, P., Majhi, P., Smith, C.E., Hussain, M.M., Sun, G., Adhikari, H., Suthram, S., Lee, B.H., Tseng, H.-H., Jammy, R.Year:
2007
Language:
english
DOI:
10.1109/IEDM.2007.4418862
File:
PDF, 4.15 MB
english, 2007