[IEEE 51st Electronic Components and Technology Conference 2001. Proceedings - Orlando, FL, USA (29 May-1 June 2001)] 2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220) - Characterization and analysis on the solder ball shear testing conditions
Xingjia Huang,, Lee, S.-W.R., Chien Chun Yan,, Hui, S.Year:
2001
Language:
english
DOI:
10.1109/ECTC.2001.927949
File:
PDF, 1.47 MB
english, 2001