A Multilayer Data Copy Test Data Compression Scheme for...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2007 Vol. 15; Iss. 7

A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design

Shih-ping Lin, Chung-len Lee, Jwu-e Chen, Ji-jan Chen, Kun-lun Luo, Wen-ching Wu
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Volume:
15
Year:
2007
Language:
english
DOI:
10.1109/TVLSI.2007.899232
File:
PDF, 749 KB
english, 2007
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