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[IEEE 2005 IEEE Conference on Control Applications, 2005. CCA 2005. - Toronto, Canada (Aug. 29-31, 2005)] Proceedings of 2005 IEEE Conference on Control Applications, 2005. CCA 2005. - An optimized regularization method using volterra model application to atrazine oxidation process

Bibes, G., Ouvrard, R., Coirault, P., Rambault, L., Trigeassou, J.C.
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Year:
2005
Language:
english
DOI:
10.1109/CCA.2005.1507108
File:
PDF, 223 KB
english, 2005
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