[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - A new robust on-wafer 1/f noise measurement and characterization system
Blaum, A., Pilloud, O., Scalea, G., Victory, J., Sischka, F.Year:
2001
Language:
english
DOI:
10.1109/ICMTS.2001.928650
File:
PDF, 509 KB
english, 2001