Determination of traces of As, B, Bi, Ga, Ge, P, Pb, Sb, Se, Si and Te in high-purity nickel using inductively coupled plasma-optical emission spectrometry (ICP-OES)
Thangavel, S., Dash, K., Dhavile, S.M., Sahayam, A.C.Volume:
131
Language:
english
Journal:
Talanta
DOI:
10.1016/j.talanta.2014.08.026
Date:
January, 2015
File:
PDF, 938 KB
english, 2015