Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits
Deval, Y., Lapuyade, H., Fouillat, R., Barnaby, H., Darracq, F., Briand, R., Lewis, D., Schrimpf, R.D.Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2002.1039685
Date:
June, 2002
File:
PDF, 207 KB
english, 2002