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[IEEE 1997 Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, MN, USA (28-30 Sept. 1997)] Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting - Improved performance and thermal stability of interdigitated power RF bipolar transistors with nonlinear base ballasting
Jaejune Jang,, Kan, E.C., Dutton, R.W., Arnborg, T.Year:
1997
Language:
english
DOI:
10.1109/BIPOL.1997.647421
File:
PDF, 362 KB
english, 1997