Electron Trap Profiling Near $\hbox{Al}_{2} \hbox{O}_{3}$/Gate Interface in TANOS Stack Using Gate-Side Trap Spectroscopy by Charge Injection and Sensing
M. B. Zahid, A. Arreghini, R. Degraeve, B. Govoreanu, A. Suhane, J. Van HoudtVolume:
31
Year:
2010
Language:
english
DOI:
10.1109/LED.2010.2057239
File:
PDF, 473 KB
english, 2010