[ECS 210th ECS Meeting - Cancun, Mexico (October...

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[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Concept for a Wafer Level Test System for Measuring Magnetic Film Properties

Gatzen, H. H., Dinulovic, Dragan, Flick, Eva, Gerdes, Holger, Feindt, Karsten, Eccarius, Mathias
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Volume:
3
Year:
2007
Language:
english
DOI:
10.1149/1.2753251
File:
PDF, 788 KB
english, 2007
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