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[IEEE 1974 IEEE International Solid-State Circuits Conference - Philadelphia, PA, USA (1974.02.15-1974.02.13)] 1974 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - Automated transistor characterization and parameter generation for linear IC design

Ruch, J., Hin-Chu Poon,, McCalla, W., Scharfetter, D.
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Year:
1974
Language:
english
DOI:
10.1109/ISSCC.1974.1155263
File:
PDF, 445 KB
english, 1974
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