[IEEE 2008 14th IEEE International On-Line Testing...

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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS

Roche, Philippe, Lysinger, Mark, Gasiot, Gilles, Daveau, Jean-Marc, Zamanian, Mehdi, Dautriche, Pierre
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Year:
2008
Language:
english
DOI:
10.1109/IOLTS.2008.60
File:
PDF, 237 KB
english, 2008
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