Calibration of embedded-cluster method for defect studies...

Calibration of embedded-cluster method for defect studies in amorphous silica

Mysovsky, Andrey S., Sushko, Peter V., Mukhopadhyay, Sanghamitra, Edwards, Arthur H., Shluger, Alexander L.
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Volume:
69
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.69.085202
Date:
February, 2004
File:
PDF, 250 KB
english, 2004
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