Calibration of embedded-cluster method for defect studies in amorphous silica
Mysovsky, Andrey S., Sushko, Peter V., Mukhopadhyay, Sanghamitra, Edwards, Arthur H., Shluger, Alexander L.Volume:
69
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.69.085202
Date:
February, 2004
File:
PDF, 250 KB
english, 2004