[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting...

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[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Bunch length measurements at Bessy

Abo-Bakr, M., Anders, W., Kuske, P., Wustefeld, G.
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Volume:
5
Year:
2003
Language:
english
DOI:
10.1109/PAC.2003.1289800
File:
PDF, 206 KB
english, 2003
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