[IEEE 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2011.04.25-2011.04.27)] Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications - Impact of compliance current overshoot on high resistance state, memory performance, and device yield of HfOx based resistive memory and its solution

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