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[IEEE 2011 IEEE Statistical Signal Processing Workshop (SSP) - Nice, France (2011.06.28-2011.06.30)] 2011 IEEE Statistical Signal Processing Workshop (SSP) - Micro-crystal orientations estimation in polarized Raman microscopy using an acquisition scheme with multiple diversities
Miron, Sebastian, Brie, David, Dossot, Manuel, Carteret, CedricYear:
2011
Language:
english
DOI:
10.1109/SSP.2011.5967664
File:
PDF, 372 KB
english, 2011