Analysis of an ESD failure mechanism on a SiC MESFET

Microelectronics Reliability 2014 / 09 Vol. 54; Iss. 9-10

Analysis of an ESD failure mechanism on a SiC MESFET

Phulpin, T., Trémouilles, D., Isoird, K., Tournier, D., Godignon, P., Austin, P.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.134
Date:
September, 2014
File:
PDF, 2.36 MB
english, 2014
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