Improving the Accuracy of Automated GUI Testing for Embedded Systems
Lin, Ying-Dar, Chu, Edward T.-H., Yu, Shang-Che, Lai, Yuan-ChengVolume:
31
Language:
english
Journal:
IEEE Software
DOI:
10.1109/MS.2013.100
Date:
January, 2014
File:
PDF, 2.91 MB
english, 2014