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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Diagnosis with convolutional compactors in presence of unknown states
Mrugalski, G., Pogiel, A., Rajski, J., Tyszer, J.Year:
2005
Language:
english
DOI:
10.1109/TEST.2005.1583998
File:
PDF, 382 KB
english, 2005