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[IEEE 2011 Design, Automation & Test in Europe - Grenoble (2011.03.14-2011.03.18)] 2011 Design, Automation & Test in Europe - Time redundant parity for low-cost transient error detection
Palframan, D J, Nam Sung Kim,, Lipasti, M HYear:
2011
Language:
english
DOI:
10.1109/DATE.2011.5763017
File:
PDF, 96 KB
english, 2011