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[IEEE 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012 - Montreal, QC, Canada (2012.06.17-2012.06.22)] 2012 IEEE/MTT-S International Microwave Symposium Digest - Rugged and reliable ohmic MEMS switches

Maciel, John, Majumder, Sumit, Lampen, James, Guthy, Charles
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Year:
2012
Language:
english
DOI:
10.1109/MWSYM.2012.6258368
File:
PDF, 805 KB
english, 2012
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