[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Failure Analysis of a MEMS Micro-Injector Printing Head
Lee, In-Yao, Hsu, Tsung-Ping, Wang, Wai W, Chiu, Yi, Tang, Hua-Kun, Tseng, Fan-Chung, Lee, KelvinYear:
2007
Language:
english
DOI:
10.1109/IPFA.2007.4378068
File:
PDF, 3.35 MB
english, 2007